I have the data on thousands of emission lines such as the one shown in the figure below. A single emission line covers $N$ pixels (11 in this example). Because the data come from counting photons, $X_i\sim\mathcal{Poisson}(\mu_i)$ where $\mu_i$ is the observed number of photons. Since $\mu_i$ is large: $X_i\approx\mathcal{N}(\mu_i,\mu_i)$. To simplify matters, I assume each $X_i$ to be independent from others. I can elaborate further if necessary.
I want to normalise the data by the factor $\sum_{i=1}^{N} X_i$: $$ Y_i = \frac{X_i}{\sum_{i=1}^{N} X_i} $$ and determine the variance on $Y_i$. Any help is greatly appreciated.
A similar problem was discussed previously. There, $X_i\sim\mathcal{N}(0,\sigma^2)$, i.e. all $X_i$ are drawn from the same distribution, which is not the case here.

Plugging in the numbers in the data but using the same formula gives S/N=347, where it is 345 in the data so this seems correct.
Would you mind explaining to me why $Y_i$ has a binomial variance?
– dmilakov Aug 24 '23 at 13:30