I have a real-valued, unknown distribution $\mu$ and would like to find the largest threshold $t \in \mathbb{R}$ such that $\Pr_{X \sim \mu}\left[X \leq t\right] \leq q$ with high probability $1-\alpha$, where $q$ is some pre-specified value $\in [0,1]$. Importantly, $t$ is not a fixed value, but a value that should be chosen based on sampled data.
In other words, I would like to obtain a probabilistic lower bound on $F^{-1}(q)$, where $F^{-1}$ is the quantile function / inverse cdf of $\mu$.
What would be an appropriate way of obtaining such a t via sampling?
I believe that How to obtain a confidence interval for a percentile? discusses a version of my problem, but is concerned with two-sided confidence intervals.
My approach would be to
- Take $N$ samples from distribution $\mu$.
- Sort them in ascending order $X_1 \leq X_2 \leq X_3 \dots \leq X_N$.
- Compute the maximum of the critical region of the one-sided binomial test, i.e. the largest $m$ s.t. $\mathrm{BT}(p>q, m, N) < \alpha$, where $p>q$ is the null-hypothesis.
- Return $X_m$.
Is that approach correct? Is there any existing literature that discusses this approach or this problem?
Thank you